Add support for large num_items to device_scan.cuh

[elstehle]

Tasks

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1. Add tests for large number of items in DeviceScan (completed by Adds tests for large number of items in cub::DeviceScan #1830)
2. Make the type of num_items a template parameter of DeviceScan algorithms
3. Use choose_offset_t as offset type within kernels of DeviceScan
4. Benchmark performance against main on V100 and H100
5. Switch tests for large number of items to use DeviceScan interface instead of the helper functions that use DispatchScan (which were introduced by Adds tests for large number of items in cub::DeviceScan #1830)
6. Remove the list of offset_types that we test for in DeviceScan to only mimic the 32- and 64-bit actually used in DeviceScan
7. Adapt thrust::scan to have the same offset types used in the device interface of CUB