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Fixes on NXms related dependent classes
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markus.kuehbach committed Mar 20, 2023
1 parent 11be3ca commit 02a61b5
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Showing 8 changed files with 16 additions and 32 deletions.
4 changes: 2 additions & 2 deletions contributed_definitions/NXms.nxdl.xml
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Expand Up @@ -238,7 +238,7 @@
<group name="grid" type="NXcg_grid" optional="true"/>
<group name="polyhedron_set" type="NXcg_polyhedron_set" optional="true"/>
<group name="point_set" type="NXcg_point_set" optional="true"/>
<group name="boundary" type="NXcg_hexadedron_set" optional="true">
<group name="boundary" type="NXcg_hexahedron_set" optional="true">
<doc>
A boundary to the volume element.
Either an instance of NXcg_hexahedron_set or of NXcg_ellipsoid_set.
Expand Down Expand Up @@ -396,7 +396,7 @@
<dim index="1" value="c"/>
</dimensions>
</field>
<field name="integration_radius" type="NX_NUMBER" units="NX_DEGREE">
<field name="integration_radius" type="NX_NUMBER" units="NX_ANGLE">
<doc>
The portion of orientation space integrated over
to compute the volume fraction.
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Expand Up @@ -21,7 +21,7 @@
#
# For further information, see http://www.nexusformat.org
-->
<definition xmlns="http://definition.nexusformat.org/nxdl/3.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" category="base" name="NXatom_set" extends="NXobject" type="group" xsi:schemaLocation="http://definition.nexusformat.org/nxdl/3.1 ../nxdl.xsd">
<definition xmlns="http://definition.nexusformat.org/nxdl/3.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" category="base" name="NXms_atom_set" extends="NXobject" type="group" xsi:schemaLocation="http://definition.nexusformat.org/nxdl/3.1 ../nxdl.xsd">
<symbols>
<doc>
The symbols used in the schema to specify e.g. dimensions of arrays.
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2 changes: 1 addition & 1 deletion contributed_definitions/NXms_score_results.nxdl.xml
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Expand Up @@ -479,7 +479,7 @@
<doc>
Current grain-related quantities.
</doc>
<field name="euler" type="NX_NUMBER" optional="true" units="NX_DEGREE">
<field name="euler" type="NX_NUMBER" optional="true" units="NX_ANGLE">
<doc>
Bunge-Euler angle triplets for each grain.
</doc>
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4 changes: 2 additions & 2 deletions contributed_definitions/nyaml/NXms.yaml
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Expand Up @@ -210,7 +210,7 @@ NXms: # (NXannealing)
exists: optional
point_set(NXcg_point_set): # how to model either or case?
exists: optional
boundary(NXcg_hexadedron_set): # how to model either or case?
boundary(NXcg_hexahedron_set): # how to model either or case?
exists: optional
doc: |
A boundary to the volume element.
Expand Down Expand Up @@ -405,7 +405,7 @@ NXms: # (NXannealing)
doc: |
The portion of orientation space integrated over
to compute the volume fraction.
unit: NX_DEGREE
unit: NX_ANGLE
dimensions:
rank: 1
dim: [[1, c]]
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Expand Up @@ -3,7 +3,7 @@ doc: |
A base class to wrap details about a spatial configuration of atoms.
symbols:
doc: The symbols used in the schema to specify e.g. dimensions of arrays.
NXatom_set:
NXms_atom_set:
(NXcg_point_set):
doc: Atom positions.
# the application-definition specific NXcg_point_set instance
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2 changes: 1 addition & 1 deletion contributed_definitions/nyaml/NXms_score_results.yaml
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Expand Up @@ -417,7 +417,7 @@ NXms_score_results:
exists: optional
doc: |
Bunge-Euler angle triplets for each grain.
unit: NX_DEGREE
unit: NX_ANGLE
dimensions:
rank: 2
dim: [[1, n_grains], [2, 3]]
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15 changes: 6 additions & 9 deletions manual/source/cgms-structure.rst
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Expand Up @@ -193,24 +193,21 @@ to hold metadata for these features:
:ref:`NXclustering`:
A description for clustering of objects (such as atoms or features).

:ref:`NXatom_set`:
A set of atoms.

:ref:`NXorientation_set`:
A set of rotations to describe the relative orientation of members of a set of features/objects.

:ref:`NXslip_system_set`:
Metadata to a set of slip system/slip system family for
a given crystal structure.

.. :ref:`NXms_point_defect_set`:
.. Metadata to a set of point defects.
:ref:`NXms_atom_set`:
Metadata to a set of atoms.

.. :ref:`NXms_dislocation_set`:
.. Metadata of a set of dislocation/disconnection (line) defects.
:ref:`NXms_dislocation_set`:
Metadata of a set of dislocation/disconnection (line) defects.

.. :ref:`NXms_interface_set`:
.. Metadata to a set of interfaces between crystals.
:ref:`NXms_interface_set`:
Metadata to a set of interfaces between crystals.

:ref:`NXms_crystal_set`:
A set of crystals, for e.g. a polycrystal, phases,
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17 changes: 2 additions & 15 deletions manual/source/em-structure.rst
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Expand Up @@ -70,17 +70,7 @@ We developed entirely new base classes. Some of them are also used for other tec
:ref:`NXibeam_column`:
A base class serving the possibility to group the components relevant for generating and shaping an ion beam of an instrument to offer focused ion beam (milling) capabilities.

:ref:`NXimage_set_em_adf`
:ref:`NXimage_set_em_bf`
:ref:`NXimage_set_em_bse`
:ref:`NXimage_set_em_chamber`
:ref:`NXimage_set_em_df`
:ref:`NXimage_set_em_diffrac`
:ref:`NXimage_set_em_ecci`
:ref:`NXimage_set_em_kikuchi`
:ref:`NXimage_set_em_ronchigram`
:ref:`NXimage_set_em_se`
:ref:`NXimage_set_em`:
:ref:`NXimage_set_em_adf`, :ref:`NXimage_set_em_bf`, :ref:`NXimage_set_em_bse`, :ref:`NXimage_set_em_chamber`, :ref:`NXimage_set_em_df`, :ref:`NXimage_set_em_diffrac`, :ref:`NXimage_set_em_ecci`, :ref:`NXimage_set_em_kikuchi`, :ref:`NXimage_set_em_ronchigram`, :ref:`NXimage_set_em_se`, :ref:`NXimage_set_em`:
Base classes for storing acquisition details for individual images or stacks of images collected via using e.g. different imaging modes. The suffixes specify **adf** annular dark field, **bf** bright field, **bse** backscattered electron, **chamber** camera to monitor the stage and chamber, **df** darkfield, **diffrac** diffraction, **ecci** electron channeling contrast imaging, **kikuchi** electron backscatter diffraction (EBSD), **ronchigram** - convergent beam diffraction pattern, **se** secondary electron, and **generic** images.

:ref:`NXinteraction_vol_em`:
Expand Down Expand Up @@ -108,10 +98,7 @@ We developed entirely new base classes. Some of them are also used for other tec
:ref:`NXscanbox_em`:
A base class to represent the component of an electron microscope which realizes a controlled deflection (and eventually shift, blanking, and/or descanning) of the electron beam to illuminate the specimen in a controlled manner. This can be used to document the scan pattern.

:ref:`NXspectrum_set_em_eels`
:ref:`NXspectrum_set_em_xray`
:ref:`NXspectrum_set_em_auger`
:ref:`NXspectrum_set_em_cathodolum`:
:ref:`NXspectrum_set_em_eels`, :ref:`NXspectrum_set_em_xray`, :ref:`NXspectrum_set_em_auger`, :ref:`NXspectrum_set_em_cathodolum`:
Base classes comparable to NXimage_set_em but for different techniques resulting in spectra. The suffixes specify **eels** electron energy loss spectroscopy, **xray** X-ray spectroscopy (EDS/STEM, EDX, SEM/EDX, SEM/EDS), **auger** Auger spectroscopy, and **cathodolum** cathodoluminescence.

:ref:`NXstage_lab`:
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