-
Notifications
You must be signed in to change notification settings - Fork 3k
New issue
Have a question about this project? Sign up for a free GitHub account to open an issue and contact its maintainers and the community.
By clicking “Sign up for GitHub”, you agree to our terms of service and privacy statement. We’ll occasionally send you account related emails.
Already on GitHub? Sign in to your account
Fix ci shield eeprom test #3430
Conversation
Could you please take a look @0xc0170? /morph test |
@mbed-bot: TEST HOST_OSES=ALL |
Result: SUCCESSYour command has finished executing! Here's what you wrote!
OutputAll builds and test passed! |
[Build 1164] |
The @mbed-bot: TEST HOST_OSES=ALL |
[Build 1165] |
@mbed-bot: TEST HOST_OSES=ALL |
[Build 1166] |
Failure was due to a K64F being knocked out by DAPLink testing, oops! Everything else looked OK, rerunnng just the K64F now. @mbed-bot: TEST HOST_OSES=ALL |
[Build 1167] |
#citestshieldforthewin |
@mbed-bot: TEST HOST_OSES=ALL |
[Build 1169] |
@LMESTM Can you resolve the conflict? thx! |
just change the place of code to have i2c_read and i2c_write together
Some device drivers use a data lenght of 0 to check if device is ready. STM32 HAL provides a dedicated service for that, so let's use it.
In continuation of previous IsDeviceReady case, let's add 1 in case length is 0 (even though not recommended)
In case the user applicaiton makes a mixed usage of unitary function (start, stop, byte write & read) with SYNC operation (write and read of data buffers with start and stop management), we need to reset the STM32 HAL state as it is by-passed by a direct call to STOP
e72eef0
to
580d964
Compare
@sg- Rebase done |
/morph test |
Result: SUCCESSYour command has finished executing! Here's what you wrote!
OutputAll builds and test passed! |
Ports for Upcoming Targets 3459: Target: Add new target UBLOX_EVK_NINA_B1 ARMmbed/mbed-os#3459 Fixes and Changes 3430: Fix ci shield eeprom test ARMmbed/mbed-os#3430 3381: STM32F1 : map ST HAL assert into MBED assert ARMmbed/mbed-os#3381 3389: STM32F2 : map ST HAL assert into MBED assert ARMmbed/mbed-os#3389 3390: STM32F3 : map ST HAL assert into MBED assert ARMmbed/mbed-os#3390 3410: STM32L4 : map ST HAL assert into MBED assert ARMmbed/mbed-os#3410 3422: Enable CAN on DISCO_F303VC ARMmbed/mbed-os#3422 3442: Dev stm i2c f1 ARMmbed/mbed-os#3442 3460: KSDK I2C: Update the return value to match the API documentation change ARMmbed/mbed-os#3460 3472: [RZ/A1H]Fix TTB setting of RO_DATA area ARMmbed/mbed-os#3472 3451: Rename KSDK2 to MCUXpresso. This is the new name of this package ARMmbed/mbed-os#3451 3391: STM32F4 : map ST HAL assert into MBED assert ARMmbed/mbed-os#3391 3454: STM32: Refactor lp_ticker.c + rtc_api.c + sleep.c + rtc_api_hal.h files ARMmbed/mbed-os#3454 3489: NUCLEO_F103RB - Correct CAN and PWM alternate-functions ARMmbed/mbed-os#3489 3405: Repair the transmit mailbox (0,1,2) empty interrupt flag not clear BUG ARMmbed/mbed-os#3405 3502: MCUXpresso I2C: Handle 0 byte write ARMmbed/mbed-os#3502 3365: [NUC472/M453] Support USB device ARMmbed/mbed-os#3365
Description
With ci test shiled tests, a few issues were faced and needed to be solved
This allows to have the I2C eeprom test to pass on F1, F2, F4 and L1 families.
Other families have not passed the tests yet - further work is needed as they embed a different I2C IP version - this will be done in a later PR.
Status
READY
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+
| NUCLEO_F103RB-ARM | NUCLEO_F103RB | tests-api-i2c | I2C - EEProm WR 10 Bytes | 1 | 0 | OK | 0.06 |
| NUCLEO_F103RB-ARM | NUCLEO_F103RB | tests-api-i2c | I2C - EEProm WR 100 Bytes | 1 | 0 | OK | 0.08 |
| NUCLEO_F103RB-ARM | NUCLEO_F103RB | tests-api-i2c | I2C - EEProm WR 2 Bytes | 1 | 0 | OK | 0.05 |
| NUCLEO_F103RB-ARM | NUCLEO_F103RB | tests-api-i2c | I2C - EEProm WR Single Byte | 1 | 0 | OK | 0.07 |
| NUCLEO_F103RB-ARM | NUCLEO_F103RB | tests-api-i2c | I2C - Instantiation of I2C Object | 1 | 0 | OK | 0.07 |
| NUCLEO_F103RB-ARM | NUCLEO_F103RB | tests-api-i2c | I2C - LM75B Temperature Read | 1 | 0 | OK | 0.06 |
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+
| NUCLEO_F207ZG-ARM | NUCLEO_F207ZG | tests-api-i2c | I2C - EEProm WR 10 Bytes | 1 | 0 | OK | 0.07 |
| NUCLEO_F207ZG-ARM | NUCLEO_F207ZG | tests-api-i2c | I2C - EEProm WR 100 Bytes | 1 | 0 | OK | 0.05 |
| NUCLEO_F207ZG-ARM | NUCLEO_F207ZG | tests-api-i2c | I2C - EEProm WR 2 Bytes | 1 | 0 | OK | 0.07 |
| NUCLEO_F207ZG-ARM | NUCLEO_F207ZG | tests-api-i2c | I2C - EEProm WR Single Byte | 1 | 0 | OK | 0.06 |
| NUCLEO_F207ZG-ARM | NUCLEO_F207ZG | tests-api-i2c | I2C - Instantiation of I2C Object | 1 | 0 | OK | 0.06 |
| NUCLEO_F207ZG-ARM | NUCLEO_F207ZG | tests-api-i2c | I2C - LM75B Temperature Read | 1 | 0 | OK | 0.07 |
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+
| NUCLEO_L152RE-ARM | NUCLEO_L152RE | tests-api-i2c | I2C - EEProm WR 10 Bytes | 1 | 0 | OK | 0.07 |
| NUCLEO_L152RE-ARM | NUCLEO_L152RE | tests-api-i2c | I2C - EEProm WR 100 Bytes | 1 | 0 | OK | 0.08 |
| NUCLEO_L152RE-ARM | NUCLEO_L152RE | tests-api-i2c | I2C - EEProm WR 2 Bytes | 1 | 0 | OK | 0.06 |
| NUCLEO_L152RE-ARM | NUCLEO_L152RE | tests-api-i2c | I2C - EEProm WR Single Byte | 1 | 0 | OK | 0.06 |
| NUCLEO_L152RE-ARM | NUCLEO_L152RE | tests-api-i2c | I2C - Instantiation of I2C Object | 1 | 0 | OK | 0.06 |
| NUCLEO_L152RE-ARM | NUCLEO_L152RE | tests-api-i2c | I2C - LM75B Temperature Read | 1 | 0 | OK | 0.05 |
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+
| NUCLEO_F446ZE-ARM | NUCLEO_F446ZE | tests-api-i2c | I2C - EEProm WR 10 Bytes | 1 | 0 | OK | 0.07 |
| NUCLEO_F446ZE-ARM | NUCLEO_F446ZE | tests-api-i2c | I2C - EEProm WR 100 Bytes | 1 | 0 | OK | 0.06 |
| NUCLEO_F446ZE-ARM | NUCLEO_F446ZE | tests-api-i2c | I2C - EEProm WR 2 Bytes | 1 | 0 | OK | 0.06 |
| NUCLEO_F446ZE-ARM | NUCLEO_F446ZE | tests-api-i2c | I2C - EEProm WR Single Byte | 1 | 0 | OK | 0.06 |
| NUCLEO_F446ZE-ARM | NUCLEO_F446ZE | tests-api-i2c | I2C - Instantiation of I2C Object | 1 | 0 | OK | 0.06 |
| NUCLEO_F446ZE-ARM | NUCLEO_F446ZE | tests-api-i2c | I2C - LM75B Temperature Read | 1 | 0 | OK | 0.06 |
+-------------------+---------------+---------------+------------------------------------+--------+--------+--------+--------------------+